Tessent software provides IC test and functional monitoring solutions that help ensure the highest test coverage, accelerate yield ramp and improve quality and reliability across the silicon lifecycle.
Built on the foundation of best-in-class solutions, Tessent logic, memory and mixed-signal test products work together using a single database to ensure total chip coverage. Tessent products minimize retooling, simplify design through automation and reduce ATPG time using hierarchical DFT flows.
Increase productivity during silicon validation and yield ramp with advanced solutions for test bring-up, silicon characterization, yield and failure analysis from Tessent Yield Learning products.
Combat escalating validation costs using Tessent Embedded Analytics, an industry leader in RISC-V trace and debug, enabling system-wide real-time debug and post-deployment analytics for complex system-on-chips (SoCs).
Meet the higher demand for zero defects and adhere to safety standards and regulations in the automotive and IC industries. Tessent Safety and Security continuously develops technologies to meet your needs of enhancing safety, optimizing security, ensuring quality and increasing reliability.