Tessent FastScan

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Overview

Tessent FastScan

Tessent FastScan is the gold standard in automatic test pattern generation, creating high-coverage, compact test sets with support for a wide range of fault models, comprehensive design rule checks, extensive clocking support, and innovative algorithms for performance-oriented pattern compaction.


Get in touch with our technical team: 1-800-547-3000

Screen shot showing scan logic tracing.

Tessent FastScan Resources







Key Features

Industry-Leading ATPG Solution

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High Test Quality

<p>Supports all traditional fault models, timing aware test, user-defined fault models, Cell-Aware test, Automotive-grade ATPG, and false and multi-cycle paths. </p>

Wireframe image of a car.

Supports any Design Flow

<p>Support for any common scan implementation. Fully integrated with Tessent Scan / ScanPro. Designed to work in all design environments using any combination of synthesis, place-and-route, and verification tools.</p>

Abstract image showing a cityscape rising from an IC chip | Tessent IC test solutions

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