Supports all traditional fault models, timing aware test, user-defined fault models, Cell-Aware test, Automotive-grade ATPG, and false and multi-cycle paths.
Support for any common scan implementation. Fully integrated with Tessent Scan / ScanPro. Designed to work in all design environments using any combination of synthesis, place-and-route, and verification tools.
Tessent Silicon Lifecycle solutions provide IP and applications that detect, mitigate and eliminate risks throughout the IC lifecycle, from DFT through continuous IC monitoring.
The Siemens Support Center provides you with everything in one easy-to-use location – knowledgebase, product updates, documentation, support cases, license/order information, and more.
Helping you achieve maximum business impact by addressing complex technology and enterprise challenges with a unique blend of development and design experience and methodology expertise.