Overview
Tessent FastScan
Tessent FastScan is the gold standard in automatic test pattern generation, creating high-coverage, compact test sets with support for a wide range of fault models, comprehensive design rule checks, extensive clocking support, and innovative algorithms for performance-oriented pattern compaction.
Get in touch with our technical team: 1-800-547-3000
Industry-Leading ATPG Solution
High Test Quality
Supports all traditional fault models, timing aware test, user-defined fault models, Cell-Aware test, Automotive-grade ATPG, and false and multi-cycle paths.
Supports any Design Flow
Support for any common scan implementation. Fully integrated with Tessent Scan / ScanPro. Designed to work in all design environments using any combination of synthesis, place-and-route, and verification tools.
Tessent blog
Tessent Silicon Lifecycle solutions provide IP and applications that detect, mitigate and eliminate risks throughout the IC lifecycle, from DFT through continuous IC monitoring.
Support Center
The Siemens Support Center provides you with everything in one easy-to-use location – knowledgebase, product updates, documentation, support cases, license/order information, and more.
EDA consulting
Helping you achieve maximum business impact by addressing complex technology and enterprise challenges with a unique blend of development and design experience and methodology expertise.