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{"heading":"Tessent Silicon Lifecycle Solutions","shareURL":"https://eda.sw.siemens.com/en-US/ic/tessent/","children":"<p>Design augmentation and linked applications that detect, mitigate and eliminate risks throughout the IC lifecycle, helping customers address their debug, test, yield, safety, security, and optimization requirements for today’s most complex SoCs.</p>"}

Tessent Silicon Lifecycle Solutions

<p>Design augmentation and linked applications that detect, mitigate and eliminate risks throughout the IC lifecycle, helping customers address their debug, test, yield, safety, security, and optimization requirements for today’s most complex SoCs.</p>
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Tessent Silicon Lifecycle Solutions Products

Solutions for IC test and functional monitoring, including best-in-class design-for-test tools and test data analytics, security, debug and in-life monitoring products that help ensure the highest test coverage, accelerate yield ramp and improve quality and reliability across the silicon lifecycle.

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DFT, Operations and Embedded Analytics

<p>Find out how our customers use advanced DFT and functional monitoring to raise test coverage, improve yield and enhance product quality, security and reliability across the silicon lifecycle. Join this experience to learn more!</br></p>

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