Design augmentation and linked applications that detect, mitigate and eliminate risks throughout the IC lifecycle, helping customers address their debug, test, yield, safety, security, and optimization requirements for today’s most complex SoCs.
Events and webinars
Tessent is an active participant in industry events around the globe. Join us for demos, keynotes, technical papers and more.
Solutions for IC test and functional monitoring, including best-in-class design-for-test tools and test data analytics, security, debug and in-life monitoring products that help ensure the highest test coverage, accelerate yield ramp and improve quality and reliability across the silicon lifecycle.