Tessent Events

Join this September 23 webinar to learn about reversible scan chain technology and how it improved diagnostic resolution by 3X in an industrial case study.

Join us for a 1 hr webinar on Thursday, 07 October, 2021 at 3:30 PM British Summer Time.

Effectively Addressing the Challenge of Securing Connected and Autonomous Vehicles

Can't make it? Register and watch it on demand.

Get a wrap-up of AESIN and watch our video about our Secure-CAV results.

Registrants can revisit Tessent’s talk: Localization of Front-End Defects using Volume Scan Diagnosis, originally presented at the IEEE Int'l Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2021.

Siemens Fellow Gajinder Panesar presented on optimizing AI chips with Embedded Analytics. The video will soon be available on demand.

Tune in to hear leaders in the field discuss technical challenges in designing AI chips. Gajinder Panesar, Siemens Fellow, talks about the value of Embedded Analytics in helping AI and ML chips reach their potential.

Optimize SoC performance and perform predictive maintenance in the field. A deep data monitoring approach offers radical improvements in time-to-revenue, product quality, reliability and safety, and profitability.