Tessent Events

Join this webinar by Siemens and PDF Solutions technologists to learn about our integrated, comprehensive end-to-end solution that includes analytics, scan diagnosis, and machine learning. 

Join us for the  Siemens Tessent DFT Forum India 2022 for the latest on Tessent features and usage.

Watch this webinar on Effectively Addressing the Challenge of Securing Connected and Autonomous Vehicles.

Get a wrap-up of AESIN and watch our video about our Secure-CAV results.

Registrants can revisit Tessent’s talk: Localization of Front-End Defects using Volume Scan Diagnosis, originally presented at the IEEE Int'l Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2021.

Siemens Fellow Gajinder Panesar presented on optimizing AI chips with Embedded Analytics. The video will soon be available on demand.

Tune in to hear leaders in the field discuss technical challenges in designing AI chips. Gajinder Panesar, Siemens Fellow, talks about the value of Embedded Analytics in helping AI and ML chips reach their potential.

Optimize SoC performance and perform predictive maintenance in the field. A deep data monitoring approach offers radical improvements in time-to-revenue, product quality, reliability and safety, and profitability.

Join this September 23 webinar to learn about reversible scan chain technology and how it improved diagnostic resolution by 4X in an industrial case study.