Tessent TestKompress, an industry-leading scan test tool, uses Embedded Deterministic Test technology to achieve the highest level of test quality while compressing scan patterns often 100X or more.
TestKompress supports all traditional fault models used for uncovering both static and dynamically activated defects. Support for user-defined fault models also allows virtually any defect mechanism to be modeled and targeted.
TestKompress offers comprehensive automation, TCL-based scripting, and introspection capabilities. To maximize throughput, automatic test pattern generation (ATPG) can be distributed across multiple processors.
Built on the patented Embedded Deterministic Test (EDT) technology, Tessent TestKompress reduces both test time and pattern volume by several orders of magnitude without any loss in fault coverage.