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Tessent Advanced DFT

Tessent TestKompress

Achieve the highest quality embedded deterministic scan test with the lowest manufacturing test cost using Tessent TestKompress.

Why Tessent TestKompress?

Tessent TestKompress, an industry-leading scan test tool, uses Embedded Deterministic Test technology to achieve the highest level of test quality while compressing scan patterns often 100X or more.

Highest defect coverage

TestKompress supports all traditional fault models used for uncovering both static and dynamically activated defects. Support for user-defined fault models also allows virtually any defect mechanism to be modeled and targeted.

Fully automated

TestKompress offers comprehensive automation, TCL-based scripting, and introspection capabilities. To maximize throughput, automatic test pattern generation (ATPG) can be distributed across multiple processors.

Lower test time and pattern count

Built on the patented Embedded Deterministic Test (EDT) technology, Tessent TestKompress reduces both test time and pattern volume by several orders of magnitude without any loss in fault coverage.

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