{"showBreadcrumbs":true,"breadcrumbs":[{"title":"Siemens EDA Software","path":"/en-US/"},{"title":"IC Tool Portfolio","path":"/en-US/ic"},{"title":"Silicon Lifecycle Solutions","path":"/en-US/ic/tessent"},{"title":"Tessent Test Solutions","path":"/en-US/ic/tessent/test"},{"title":"Tessent TestKompress","path":""}],"tagline":"Overview","title":"Tessent TestKompress","description":"Tessent TestKompress delivers the highest quality embedded deterministic scan test with the lowest manufacturing test cost. It uses a patented on-chip compression technique to create scan pattern sets that have dramatically less test data volume and reduced test time on the automatic test equipment.","pricingCurrency":"US$","image":{"url":"//images.ctfassets.net/17si5cpawjzf/f195268bb4313e09f268c60bcc18bc61efe3f024c2e3739d627b85520798d061/fdf83a4b0c183d71e90b2ef24f88148c/L4-tessent-TK-offer-image-640x480.jpg?w=640","alt":"Illustration of embedded test compression | Tessent TestKompress delivers the highest quality embedded deterministic scan test with the lowest manufacturing test cost. ","linkData":"{\"name\":\"tessent-testkompress-640x480\",\"id\":\"f195268bb4313e09f268c60bcc18bc61efe3f024c2e3739d627b85520798d061\",\"contentType\":\"image/jpeg\"}"},"secondaryButton":{"text":"Read Fact Sheet","resource":{"ids":["51oOuWee2uIu5YDxy0leAm"],"mode":"selected","query":{"q":"","sorts":[{"field":"publishedDate","order":"desc"}],"filters":[{"field":"collection","values":["resource"],"operator":"OR"}],"postFilters":[{"field":"products.id","values":["852852118"],"operator":"OR"},{"field":"resourceType","values":["Fact Sheet"],"operator":"OR"}],"verboseLocalization":true},"idsQuery":{"size":1,"filters":[{"field":"collection","values":["resource"],"operator":"OR"},{"field":"id","values":["51oOuWee2uIu5YDxy0leAm"],"operator":"OR"}],"verboseLocalization":true}},"env":"master"},"phoneIcon":true,"moreInformation":"Get in touch with our technical team: 1-800-547-3000"}