Tessent TestKompress delivers the highest quality embedded deterministic scan test with the lowest manufacturing test cost. It uses a patented on-chip compression technique to create scan pattern sets that have dramatically less test data volume and reduced test time on the automatic test equipment.
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Tessent TestKompress uses Embedded Deterministic Test technology to achieve the highest
level of test quality while compressing scan patterns often 100X or more.
<p>Tessent TestKompress supports all traditional fault models used for uncovering both static and dynamically activated defects. Support for user-defined fault models (UDFM) also allows virtually any defect mechanism to be modeled and targeted. </p>
<p>Tessent TestKompress is built on the Tessent Connect end-to-end automation platform, which offers comprehensive automation, TCL-based scripting, and introspection capabilities. To maximize throughput, automatic test pattern generation (ATPG) can be distributed across multiple processors.</p>
<p>Built on the patented Embedded Deterministic Test (EDT) technology, Tessent TestKompress reduces both test time and pattern volume by several orders of magnitude without any loss in fault coverage. </p>
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