Tessent BoundaryScan is a complete solution for automated generation and integration of on-chip test infrastructure, boundary scan, and test access port.
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Tessent BoundaryScan logic can be accessed throughout the life of the IC, including manufacturing test at all package levels, silicon debug, and system verification to detect defects before shipment, reducing field support costs and increasing customer satisfaction.
Tessent BoundaryScan automatically generates and integrates the RTL code for the TAP controller and boundary scan cells into the design RTL or gate-level netlist. It generates the scripts for logic synthesis, a boundary scan description language (BSDL) file, simulation testbenches, and test patterns for manufacturing test.
Tessent Boundary scan supports IEEE 1149.1 custom boundary scan cells and contactless I/O test and has an option for 1149.6 boundary scan support.
Tessent BoundaryScan automatically connects IJTAG networks and instruments to the newly inserted TAP controller and generates resulting Instrument Connectivity Language (ICL) files. I/O tests are generated in Procedural Description Language (PDL) format. Both SVF and PDL are supported for user-defined tests.
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