Ensure quality

Get the highest quality deterministic scan test with the lowest manufacturing test cost, using patented on-chip compression to reduce test data volume and cut test time.

Reduce design for testability (DFT) development time and manufacturing test cost by decoupling core-level and chip-level DFT requirements.

Tessent TestKompress with Automotive-grade ATPG overcomes the quality limitations of traditional DFT methodologies by targeting defects in ICs at the transistor and interconnect levels

Achieve comprehensive automation and integration of test, repair, debug and characterization of embedded memories.

Satisfy the requirements of ICs for the fast-growing automotive electronics market and meet the demands of new markets and technologies.

Simulate transistor-level defects for analog, mixed-signal and non-scan digital circuits. Meet quality standards such as ISO26262 with automated coverage assessment.

Lee Harrison, Director of Product Marketing for Tessent, talks about Streaming Scan Network (SSN) buses and the next-generation of design-for-test technology in this interview with Electronics Weekly interview.

Learn about automotive cyber safety and security trends and the future of mobility technology security. Find out how Siemens EDA represents a smart choice for automotive companies within the ecosystem.

Ensure quality, enhance safety, optimize performance and increase reliability by embedding small modules directly into your system-on-chip (SoC), allowing non-intrusive observation of what's happening in your design.

Read how a growing number of standards and regulations within the automotive ecosystem are promising to save development costs by fending off cyberattacks.