Tessent Streaming Scan Network

{"showBreadcrumbs":true,"breadcrumbs":[{"title":"Siemens EDA Software","path":"/en-US/"},{"title":"IC Tool Portfolio","path":"/en-US/ic"},{"title":"Silicon Lifecycle Solutions","path":"/en-US/ic/tessent"},{"title":"Tessent Test Solutions","path":"/en-US/ic/tessent/test"},{"title":"Tessent Streaming Scan Network","path":""}],"tagline":"Overview","title":"Tessent Streaming Scan Network","description":"Tessent Streaming Scan Network packetizes test data to dramatically reduce DFT implementation effort and reduce manufacturing test cost. By decoupling core-level and chip-level DFT requirements, each core can be designed with the most optimal compression configuration for that core. ","pricingCurrency":"US$","image":{"url":"https://images.sw.cdn.siemens.com/siemens-disw-assets/public/5UuLpbFeKocx9ccM2m495P/en-US/SSN_figure-640x480.jpg?w=640","alt":"Illustration of the Tessent Streaming Scan Network architecture | Tessent Streaming Scan Network packetizes test data to dramatically reduce DFT implementation effort and reduce manufacturing test cost. ","linkData":"{\"name\":\"SSN figure-640x480\",\"id\":\"5UuLpbFeKocx9ccM2m495P\",\"contentType\":\"image/jpeg\"}"},"secondaryButton":{"text":"Read Fact Sheet","env":"master","resource":{"ids":["ym5Nxi3JHTXE1J8tu0MgU"],"mode":"selected","query":{"q":"Streaming","sorts":[{"field":"publishedDate","order":"desc"}],"filters":[{"field":"collection","values":["resource"],"operator":"OR"}],"postFilters":[],"verboseLocalization":true},"idsQuery":{"size":1,"filters":[{"field":"collection","values":["resource"],"operator":"OR"},{"field":"id","values":["ym5Nxi3JHTXE1J8tu0MgU"],"operator":"OR"}],"verboseLocalization":true}},"locale":"en-US"},"phoneIcon":true,"moreInformation":"Get in touch with our technical team: 1-800-547-3000"}
Overview

Tessent Streaming Scan Network

Tessent Streaming Scan Network packetizes test data to dramatically reduce DFT implementation effort and reduce manufacturing test cost. By decoupling core-level and chip-level DFT requirements, each core can be designed with the most optimal compression configuration for that core.


Get in touch with our technical team: 1-800-547-3000

Illustration of the Tessent Streaming Scan Network architecture | Tessent Streaming Scan Network packetizes test data to dramatically reduce DFT implementation effort and reduce manufacturing test cost.

Tessent Streaming Scan Network Resources

Key Features

No-Compromise DFT

Tessent Streaming Scan Network delivers the promise of true hierarchical plug-n-play DFT. By decoupling core-level DFT configuration from chip level DFT resources, the DFT planning and implementation effort is dramatically reduced while simultaneously reducing manufacturing test cost.

{"items":[{"title":"Shortened DFT Development Time","subtitle":"Minimize DFT Effort","description":"<p>With Tessent Streaming Scan Network, core and chip level DFT is completely decoupled. Core-level compression can be optimized without considering other cores or chip level resources. Decisions such as core grouping are made during pattern re-targeting rather than design time. </p>","image":"https://images.sw.cdn.siemens.com/siemens-disw-assets/public/1ARsYKS9h5m4vq9trJGKAA/en-US/tessent-feature-195008932-640x480.jpg?w=640&q=60","imageAlt":"Abstract image showing a cityscape rising from an IC chip | Tessent IC test solutions","imageTitle":"Abstract image showing a cityscape rising from an IC chip | Tessent IC test solutions","rightIcon":"fal fa-long-arrow-right fa-lg"},{"title":"Full Routing and Timing Closure","subtitle":"Design-Friendly DFT","description":"<p>By eliminating top-level test mode muxing and routing of DFT signals from chip level pins to each core, routing and timing closure of DFT signals is dramatically simplified. Streaming Scan Network is ideal for tile-based design with abutment. </p>","image":"https://images.sw.cdn.siemens.com/siemens-disw-assets/public/3rVyhabQgryx170axKcHSC/en-US/tessent-feature-56211159-640x480.jpg?w=640&q=60","imageAlt":"IC schematics with light bursts | Tessent ScanPro includes the VersaPoint test point technology that directly targets ATPG pattern volume reduction of 2X to 4X in addition to increasing logic BIST test coverage. ","imageTitle":"IC schematics with light bursts | Tessent ScanPro includes the VersaPoint test point technology that directly targets ATPG pattern volume reduction of 2X to 4X in addition to increasing logic BIST test coverage. ","rightIcon":"fal fa-long-arrow-right fa-lg"},{"title":"Reduced Test Time and Volume","subtitle":"Reduce Test Costs","description":"<p>There is no need to compromise manufacturing test cost. Streaming Scan Network data packets contain 100 payloads. By combining automatic bandwidth tuning and local generation of DFT signals, whitespace is virtually eliminated from the test data. Identical cores can be tested at constant cost, with diagnosis support. </p>","image":"https://images.sw.cdn.siemens.com/siemens-disw-assets/public/7GNgIaCfZHdgmrRrsqB8u5/en-US/tessent-feature-51490712-640x480.jpg?w=640&q=60","imageAlt":"Abstract image of an IC on a board | Tessent IC test solutions","imageTitle":"Abstract image of an IC on a board | Tessent IC test solutions","rightIcon":"fal fa-long-arrow-right fa-lg"}],"env":"master","locale":"en-US"}

Minimize DFT Effort

Shortened DFT Development Time

<p>With Tessent Streaming Scan Network, core and chip level DFT is completely decoupled. Core-level compression can be optimized without considering other cores or chip level resources. Decisions such as core grouping are made during pattern re-targeting rather than design time. </p>

Abstract image showing a cityscape rising from an IC chip | Tessent IC test solutions

Design-Friendly DFT

Full Routing and Timing Closure

<p>By eliminating top-level test mode muxing and routing of DFT signals from chip level pins to each core, routing and timing closure of DFT signals is dramatically simplified. Streaming Scan Network is ideal for tile-based design with abutment. </p>

IC schematics with light bursts | Tessent ScanPro includes the VersaPoint test point technology that directly targets ATPG pattern volume reduction of 2X to 4X in addition to increasing logic BIST test coverage.

Reduce Test Costs

Reduced Test Time and Volume

<p>There is no need to compromise manufacturing test cost. Streaming Scan Network data packets contain 100 payloads. By combining automatic bandwidth tuning and local generation of DFT signals, whitespace is virtually eliminated from the test data. Identical cores can be tested at constant cost, with diagnosis support. </p>

Abstract image of an IC on a board | Tessent IC test solutions

"With Tessent Streaming Scan Network technology, we are able to offer our customers a scalable test access solution ideal for today’s and tomorrow’s advanced IC designs. SSN significantly reduces the effort needed to make complex designs highly testable."

Sangyun Kim, Vice President of Design Technology Team , Samsung Electronics

Ready to learn more about Tessent?

We're standing by to answer your questions.

Tessent Blog

Tessent Silicon Lifecycle solutions provide IP and applications that detect, mitigate and eliminate risks throughout the IC lifecycle, from DFT through continuous IC monitoring.

two squares on top of each other

Support Center

The Siemens Support Center provides you with everything in one easy-to-use location – knowledgebase, product updates, documentation, support cases, license/order information, and more.

EDA Consulting

Helping you achieve maximum business impact by addressing your complex technology and enterprise challenges with a unique blend of development experience, design knowledge, and methodology expertise.