Tessent ScanPro
Tessent ScanPro provides advanced scan DFT features that maximize the performance of scan-based test, such as those provided by Tessent TestKompress, Tessent FastScan, and Tessent LogicBIST products.
Get in touch with our technical team: 1-800-547-3000
Advanced Testability Analysis and Readiness
Tessent ScanPro is the industry’s highest capacity and most flexible scan test solution.
Reduce Scan Integration Effort and Time
Advanced scan integration capabilities include:
Partitioning of scan chains based on clock domains, power domains, and physical clusters
Re-use of existing scan segments/chains and reuse existing shift registers
Insertion of dedicated and shared wrapper cells for core-based, hierarchical DFT
VersaPoint Test Point Technology
Tessent ScanPro includes the VersaPoint test point technology that directly targets ATPG pattern volume reduction of 2X to 4X in addition to increasing logic BIST test coverage.
Part of Tessent Connect
Tessent ScanPro is integrated into the end-to-end automation flow of Tessent Connect and includes advanced design introspection and editing capabilities. Introspection is based on TCL and a comprehensive set of related manipulation commands. Design editing at both the RTL and gate level is supported through a rich set of built-in commands.
Tessent Blog
Tessent Silicon Lifecycle solutions provide IP and applications that detect, mitigate and eliminate risks throughout the IC lifecycle, from DFT through continuous IC monitoring.
Support Center
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EDA Consulting
Helping you achieve maximum business impact by addressing your complex technology and enterprise challenges with a unique blend of development experience, design knowledge, and methodology expertise.