Tessent ScanPro is the industry’s highest capacity and most flexible scan test solution.
Advanced scan integration capabilities include:
Partitioning of scan chains based on clock domains, power domains, and physical clusters
Re-use of existing scan segments/chains and reuse existing shift registers
Insertion of dedicated and shared wrapper cells for core-based, hierarchical DFT
Tessent ScanPro includes the VersaPoint test point technology that directly targets ATPG pattern volume reduction of 2X to 4X in addition to increasing logic BIST test coverage.
Tessent ScanPro is integrated into the end-to-end automation flow of Tessent Connect and includes advanced design introspection and editing capabilities. Introspection is based on TCL and a comprehensive set of related manipulation commands. Design editing at both the RTL and gate level is supported through a rich set of built-in commands.
Tessent Silicon Lifecycle solutions provide IP and applications that detect, mitigate and eliminate risks throughout the IC lifecycle, from DFT through continuous IC monitoring.
The Siemens Support Center provides you with everything in one easy-to-use location – knowledgebase, product updates, documentation, support cases, license/order information, and more.
Helping you achieve maximum business impact by addressing your complex technology and enterprise challenges with a unique blend of development experience, design knowledge, and methodology expertise.