Tessent ScanPro provides advanced scan DFT features that maximize the performance of scan-based test, such as those provided by Tessent TestKompress, Tessent FastScan, and Tessent LogicBIST products.
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Tessent ScanPro is the industry’s highest capacity and most flexible scan test solution.
Scan Test Integration
<p>Advanced scan integration capabilities include:</br></p><ul><li><p>Partitioning of scan chains based on clock domains, power domains, and physical clusters</br></p></li><li><p>Re-use of existing scan segments/chains and reuse existing shift registers</br></p></li><li><p>Insertion of dedicated and shared wrapper cells for core-based, hierarchical DFT</p></li></ul><p></p>
Pattern Volume Reduction
<p>Tessent ScanPro includes the VersaPoint test point technology that directly targets ATPG pattern volume reduction of 2X to 4X in addition to increasing logic BIST test coverage. </p>
<p>Tessent ScanPro is integrated into the end-to-end automation flow of Tessent Connect and includes advanced design introspection and editing capabilities. Introspection is based on TCL and a comprehensive set of related manipulation commands. Design editing at both the RTL and gate level is supported through a rich set of built-in commands. </p>
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