Create an infrastructure that makes designs more testable. Silicon lifecycle management solutions achieve high-quality test, identify defects and hidden yield limiters and move beyond test into system debug and validation. This ecosystem of tools effectively analyzes data to provide critical system insights that can then be used for in-life monitoring.
Ensure the highest test quality, accelerate yield ramp and improve safety, security and reliability across the silicon lifecycle using best-in-class solutions for design-for-test (DFT), debug and in-life monitoring plus powerful data analytics.