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Calibre Design for Manufacturing

At nanometer nodes, design sign-off requires more than DRC and LVS. Calibre DFM yield analysis, printability, and performance validation tools provide layout modifications and design flow-based yield-enhancing operations and ensure IC design optimization, performance, and reliability.

Calibre confidence

Calibre Design for Manufacturing

The Calibre Design for Manufacturing (DFM) tool suite provides an expansive set of yield analysis solutions that account for random, systematic, and parametric yield loss. These analysis solutions are the basis for automated layout enhancements that improve printability and performance. The Calibre tools enable a wide variety of smart design optimizations for both yield and reliability without sacrificing area.

ECA CPU brand evolution - robot hand holding microchip

Calibre Design for Manufacturing Products

Calibre DFM tools deliver foundry know-how upstream to design engineers, empowering them to design for optimal performance, manufacturability, and yield.

Stylized image of IC design. Rectangles in multiple shaded of blue represent layers. Purple dots represent inserted vias, green lines represent inserted parallel runs, and grid blocks represent inserted filler/DCAP cells.
Design stage layout optimization
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Calibre DesignEnhancer

Calibre DesignEnhancer automated layout analysis delivers Calibre correct-by-construction layout optimization during full custom design and P&R implementation to improve reliability and manufacturability and reduce time to market.

Calibre YieldEnhancer / colorized IC layout screenshot
Optimized Layout Modification
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Calibre YieldEnhancer with SmartFill

The Calibre YieldEnhancer tool is an analysis-based layout modification platform providing an automated analysis-based approach to layout enhancements that help improve yield without sacrificing area.

Calibre YieldAnalyzer / test probes touching a wafer
CAA and DFM Scoring
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Calibre YieldAnalyzer

The Calibre YieldAnalyzer tool provides comprehensive methods to analyze design manufacturability and reliability, including critical area analysis, DFM scoring, and via redundancy checking.

Calibre CMPAnalyzer / close-up of chips on a wafer
Reduce Planarity Variation
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Calibre CMPAnalyzer

The Calibre CMPAnalyzer tool enables designers to examine a variety of CMP effects and determine the optimum modifications for improving performance and yield.

Calibre LFD / chip with connections
Reduce Process Variability
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Calibre LFD

The Calibre LFD tool captures a design’s response to manufacturing process effects, enabling engineers to fix hotspots, variability, and reliability issues before tape-out.