The Calibre YieldAnalyzer tool supports many of the leading foundries. Calibre YieldAnalyzer technology supports CAA, DFM scoring, and via redundancy checking. It helps customers analyze designs so they can optimize layouts for manufacturing.
DFM scoring quantifies design sensitivity to a systemic issue as represented by a rule deck. To implement DFM scoring, a rule deck is configured with a list of recommended rules and estimates for weighting factors for each rule, based on foundry-recommended rule priorities.
The Calibre YieldAnalyzer tool performs critical area analysis on all base and interconnect layers to identify areas of a layout with excess vulnerability to random particle defects, such as shorts and opens. A CAA deck is configured with the layer information foundry defect density distributions for each process and defect type (open/short).
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Across all process nodes and design styles, the Calibre toolsuite delivers accurate, efficient, comprehensive IC verification and optimization, while minimizing resource usage and tapeout schedules.