Tessent ScanPro provides advanced scan DFT features that maximize the performance of scan-based test, such as those provided by Tessent TestKompress, Tessent FastScan, and Tessent LogicBIST products.
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Tessent ScanPro is the industry’s highest capacity and most flexible scan test solution.
Scan Test Integration
Advanced scan integration capabilities include:
Partitioning of scan chains based on clock domains, power domains, and physical clusters
Re-use of existing scan segments/chains and reuse existing shift registers
Insertion of dedicated and shared wrapper cells for core-based, hierarchical DFT
Pattern Volume Reduction
Tessent ScanPro includes the VersaPoint test point technology that directly targets ATPG pattern volume reduction of 2X to 4X in addition to increasing logic BIST test coverage.
Tessent ScanPro is integrated into the end-to-end automation flow of Tessent Connect and includes advanced design introspection and editing capabilities. Introspection is based on TCL and a comprehensive set of related manipulation commands. Design editing at both the RTL and gate level is supported through a rich set of built-in commands.
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