Tessent Advanced DFT
Tessent LogicBIST
Tessent LogicBIST is the industry’s leading built-in self-test solution for testing the digital logic components of integrated circuits. It is an ideal test solution for safety-critical devices such as ICs used in automotive and medical applications.
Why Tessent LogicBIST?
Tessent LogicBIST efficiently integrates with Tessent MissionMode and Tessent TestKompress to create a complete in-system and manufacturing test solution for safety-critical devices.
Improves test coverage
Engineered for hybrid TK/LBIST applications, the Tessent VersaPoint test point technology improves ATPG pattern count and logic BIST testability at the same time, improving LBIST coverage by 2%-4%.
Meets in-system test time
By observing circuit data at each shift cycle, not only in capture, the Observation Scan Technology (OST) significantly reduces pattern count needed to reach target logic BIST test coverage.
Boosts test efficiency
Tessent Hybrid TK/LBIST efficiently combines the logic architecture of Tessent TestKompress and LogicBIST to improve test quality while avoiding any area penalty, reaping the benefits of both ATPG compression and logic BIST.
Infineon reduces LBIST test time to functional safety
In this presentation, Daniel Tille of Infineon shows the use of LogicBIST with Observation Scan Technology, which is proven to drastically reduce logic built-in self-test (LBIST) test time for Infineon Automotive microcontrollers (MCUs).
