Tessent Advanced DFT
Tessent In-System Test
Continuous testing and monitoring of devices is required to guarantee optimal performance, reliability and safety throughout their operation. Tessent In-System Test enables the application of high-quality deterministic test patterns for in-system/in-field testing during the lifecycle of your chip.
Why use Tessent In-System Test?
Tessent In-System Test provides the embedded hardware and necessary software to enable application of high-quality deterministic test patterns while reducing test time as compared to traditional logic BIST.
Enables adaptive test
In-system deterministic test enables you to change test patterns as new defects and fault models emerge or as test content needs change.
Works with Tessent SSN
The in-system test controller fetches data from bus interfaces, driving the Streaming Scan Network bus network internally to apply scan data packets to cores for testing, lowering test time and improving power profile during test.
Re-uses test patterns
Re-uses existing on-chip test infrastructure to target latent, intermittent, random or age-related defects during the lifespan of the product by enabling re-use of IJTAG- and SSN-based patterns for in-system applications.
Responds to silent data errors
Delivers fully automated hardware and software capabilities needed to respond to aging and environmental factors that manifest as Silent Data Errors/Corruption. Test content can be changed as test requirements evolve.
