Tessent Yield Learning
Tessent Diagnosis
Using failure data from manufacturing test, scan test patterns, and design information, Tessent Diagnosis identifies the location and classification of the defect causing the failure.
Why Tessent Diagnosis?
The Tessent Diagnosis solution identifies the type and location of defects, establishing the foundation for diagnosis-driven yield and failure analysis.
Accurately identify defects and timing errors
Use layout-aware and cell-aware technology to determine a defect’s most probable failure mechanism, logic location and physical location.
Cell-aware diagnosis
Perform transistor-level diagnosis to identify defects inside standard cells. This capability leverages the same cell-aware fault model used for cell-aware ATPG and works for with any pattern type.
High-resolution chain diagnosis
Improve diagnosis by >1.5x on advanced process nodes (5nm and below). Provides accurate transistor-level isolation for scan chain defects. Ensures deep point defects can be isolated in precision.
Correlate with DFM analysis
Diagnosis results can be correlated with DFM analysis results to identify critical design features. Tessent Diagnosis can read result databases (RDB) from Calibre.
Trusted technology
Tessent Diagnosis is the market leader in scan diagnosis technology with the highest accuracy rate. More than 80% of reports generated using Tessent Diagnosis have been confirmed using a failure analysis process.
