stack of blue wafers

Tessent Yield Learning

Decrease time to yield, manage manufacturing excursions and recover yield caused by systematic defects. By understanding how to manage and optimize the test and data collection environment, yield learning solutions can be setup to identify systematic defects that cause low yield, saving time.

Reduce complexity with Tessent Yield Learning solutions

With complexity on the rise, Tessent Yield Learning is designing tools to reduce complexity without compromising quality or profitability. We are helping customers adapt to changing environments while also decreasing time-to-market and reducing cost.

A large, blue semiconductor wafer

Join us for the chain diagnosis improvements webinar

Learn how to identify and eliminate yield issues quickly and efficiently in this on-demand webinar.

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