Overview
Tessent YieldInsight
Tessent YieldInsight significantly reduces cycle time to root cause of yield loss by statistically analyzing diagnosis data to identify and separate systematic yield limiters before any failure analysis is done.
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Reduce Time to Root Cause of Yield Loss
Using specialized data mining and statistical analysis techniques, the product eliminates noise from diagnosis data to determine the underlying root causes, identify systematic yield limiters, and select the best devices for failure analysis.
Identify Hidden Yield Limiters
Tessent YieldInsight identifies the cause of systematic yield loss and provides guidance through
the process of selecting die for failure analysis.
Remove Noise From Diagnosis Results
Root cause deconvolution (RCD) technology in Tessent YieldInsight removes noise from diagnosis
results and determines the underlying root causes. It selects and filters populations of failing die, grouping die that are failing for similar reasons, and analyzing various aspects of these populations to identify and locate systematic yield loss mechanisms.
Works with Tessent Diagnosis
Tessent YieldInsight statistically analyzes the layout-aware and cell-aware diagnosis results from Tessent Diagnosis to identify and separate systematic yield limiters before any failure analysis is done. This eliminates the need for costly physical localization and reduces the time to determining root cause of yield loss from weeks to days.
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