Tessent SiliconInsight

Overview

Tessent SiliconInsight

Tessent SiliconInsight provides an automated interactive environment for test bring-up, debug, and silicon characterization of devices containing Tessent ATPG, EDT, BIST, and/or IJTAG test structures.


Get in touch with our technical team: 1-800-547-3000

flowchart showing different test environments | Tessent SiliconInsight provides an automated interactive environment for test bring-up, debug, and silicon characterization of devices containing Tessent ATPG, EDT, BIST, and/or IJTAG test structures.

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Key Features

Validation and Debug Productivity

Tessent SiliconInsight greatly increases productivity for chip designers and test engineers during silicon validation and debug, speeding time-to-market. The solution works in a bench-top environment and connects to any debug, performance, or bring-up board, accessing up to 120 device pins.

Validate Test Patterns Before First Silicon

Validate test patterns before first silicon using the design in a standard simulator, inject faults, characterize potential
failure scenarios without silicon.

Stylized ICs | Tessent IC test solutions

Low-Cost, High-Availability Characterization

Desktop debug environment for ATPG, MBIST, LBIST, and IJTAG through access to up to 120 device pins using 3rd party USB adaptors. Shmoo capability of power and clock through GPIB.

Abstract image showing a cityscape rising from an IC chip | Tessent IC test solutions

Link the Power of IJTAG with the ATE

The ATE-Connect technology creates an industry-standard interface to eliminate communication barriers between proprietary, tester-specific software and design-for-test (DFT) platforms.

Abstract image of an IC on a board | Tessent IC test solutions

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