The Tessent Diagnosis solution identifies the type and location of defects, establishing the foundation for diagnosis-driven yield and failure analysis.
Use layout-aware and cell-aware technology to determine a defect’s most probable failure mechanism, logic location and physical location.
Perform transistor-level diagnosis to identify defects inside standard cells. This capability leverages the same cell-aware fault model used for cell-aware ATPG and works for with any pattern type.
Improve diagnosis by >1.5x on advanced process nodes (5nm and below). Provides accurate transistor-level isolation for scan chain defects. Ensures deep point defects can be isolated in precision.
Diagnosis results can be correlated with DFM analysis results to identify critical design features. Tessent Diagnosis can read result databases (RDB) from Calibre.
Tessent Diagnosis is the market leader in scan diagnosis technology with the highest accuracy rate. More than 80% of reports generated using Tessent Diagnosis have been confirmed using a failure analysis process.