The Calibre xACT solution offers parasitic extraction options for interconnect modeling that ensure accurate capture of parasitic and layout-dependent effects for non-planar devices in advanced node designs, simultaneous multi-corner extraction for efficient processing, and accurate identification of EM current density violations, as well as accurate extraction and modeling for 3D IC package designs.
![Parasitic Extraction Technologies for Advanced Node and 3D-IC Design](https://images.sw.cdn.siemens.com/siemens-disw-assets/public/c77e03e88b784b60265be015fbaaad863c51ea2522bb5f4ad52f9031d0337f7d/en-US/TN_cornermodeling-B7552E3F.png?auto=format,compress&w=843&q=60)