Digital screen displaying blue binary computer code.

Functional Fault Grading for DFT

Questa One Sim FX

Questa One Sim FX is a high-performance simulator used in Design-For-Test (DFT) for functional fault grading to enhance defect coverage for complex ICs. Integration with market-leading Tessent TestKompress offers a powerful solution for approaching zero defects parts per million (DPPM).

Why Questa One Sim FX for functional fault grading?

The automated flow and support of Tessent's format for advanced fault models provides a unique solution for improving the reliability of high-performance and complex ICs.

Address fault coverage gaps

Address faults that can only be activated by functional patterns to improve overall defect coverage.

Increase the fault coverage

Increase the fault coverage beyond the scope of structural fault models.

Coverage for mixed-signal circuits

Functional fault grading helps in verifying the correct operation and robustness of mixed-signal circuits such as security circuitry and analog blocks.

Questa One Sim FX

Enhance defect coverage with functional fault grading

While ATPG scan-based testing is critical for detecting low-level, structural faults, functional fault grading helps ensure that the overall functional integrity of the device is maintained and that test patterns reflect the conditions that the chip will experience in real-world usage. This combination of structural and functional fault analysis helps provide a more comprehensive and robust testing strategy.

Close-up view of an electronic chip on a blue printed circuit board.

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