Calibre Mask Data Preparation

Calibre Mask Data Preparation (MDP) tools enable mask data format conversion and verification for mask fabrication including the latest multi-beam mask formats in a fully compatible Calibre platform.

Calibre Mask Data Preparation Products

Calibre Mask Data Preparation products are part of the integrated Calibre platform, enabling you to complete all resolution enhancement processing and mask data format conversion tasks in one mask fabrication batch run using a single control language with best-in-class performance.

A silicon wafer with blue-tinted lighting, showing detailed grid pattern of integrated circuits across its surface. The perspective emphasizes the wafer's circular shape and precise geometric patterns.

Product

Calibre FRACTURE

Exports mask making data directly to target mask writing formats without changing tools or creating large intermediate files. Supported formats include MEBES, JEOL, Micronic, NuFlare VSB and MBF, OASIS.MASK, and OASIS.MBW.

Close-up photo of a silicon wafer mounted in a circular testing or manufacturing platform, showing detailed grid pattern across the wafer's surface with metallic and blue mounting hardware around the edges.

Product

Calibre MDPverify

Checks final mask writer data against the original GDSII or OASIS definition. It supports tracking of design updates by confirming the presence of changes in the final mask data.

Close-up view of a silicon wafer displaying iridescent blue and purple reflections across its surface. The wafer shows a precise grid pattern of integrated circuits with metallic edge visible at bottom right.

Product

Calibre MDPview

Enables quick and easy review of design data in GDSII and OASIS format, as well as in all popular mask writer pattern formats and data assemblies through the respective job decks.

Hands wearing blue nitrile gloves hold a silicon wafer showing a checkerboard pattern of integrated circuits with rainbow-like light diffraction effects visible across its surface.

Product

Calibre MASKOPT

Reduces mask cost and mask writing time by lowering the total shot count through advanced pre-processing of the fractured data.

Silicon wafer in a clear plastic holder showing a dark surface with grid pattern of rectangular sections. A vertical stripe of rainbow colors (green, orange, pink) runs through the center of the wafer.

Product

Calibre MDPmerge

Enables highly scalable cross-chip merging for NuFlare VSB11 fracture.

Close-up of a silicon wafer with blue and purple illumination showing grid pattern of squares. A transparent container or testing apparatus is visible in the foreground.

Product

Calibre MAPI

Extends the tcl programming language set available in Calibre MDPview with dedicated functions supporting the extraction and validation of suitable locations for mask metrology.