Overview
Calibre YieldAnalyzer
The Calibre YieldAnalyzer tool examines a layout and scores the design for both critical area analysis and DFM scoring. The intuitive interface helps designers analyze the results so they know what, where and how they can most improve their designs for manufacturability.
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Comprehensive Solution for Design Optimization
The Calibre YieldAnalyzer tool supports many of the leading foundries. Calibre YieldAnalyzer technology supports CAA, DFM scoring, and via redundancy checking. It helps customers analyze designs so they can optimize layouts for manufacturing.
Enables DFM Scoring
DFM scoring quantifies design sensitivity to a systemic issue as represented by a rule deck. To implement DFM scoring, a rule deck is configured with a list of recommended rules and estimates for weighting factors for each rule, based on foundry-recommended rule priorities.
CAA & Via Redundancy Score Designs for Random Defects
The Calibre YieldAnalyzer tool performs critical area analysis on all base and interconnect layers to identify areas of a layout with excess vulnerability to random particle defects, such as shorts and opens. A CAA deck is configured with the layer information foundry defect density distributions for each process and defect type (open/short).
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Design with Calibre blog
Across all process nodes and design styles, the Calibre tool suite delivers accurate, efficient, comprehensive IC verification and optimization, while minimizing resource usage and tapeout schedules.