1. Home
Interior of a dimly lit data center server room illuminated by yellow and blue lights.

Driving product value with diagnosis

Product value add is just one of the reasons why diagnosis matters. By ensuring data is collected and the optimal value is generated from the learning of that data, can lead to millions of dollars in savings.

>1.5x

Resolution improvement

Improve diagnosis by >1.5x on advanced process nodes (5nm and below) with high-resolution chain diagnosis 

85%

Reduced cycle time of failure analysis cost

Accelerate time for each Failure Analysis with improved resolution of suspect predictions

$1M+

Impact of yield improvement

The value of even a 1% improvement in product yield can amount to millions of dollars per week for a high-volume device if you can identify systematic or manufacturing defects

Diagnosis is an incredibly important step. We're seeing the speed of diagnosing issues is having a tangible impact on our time to market. Anything that can accelerate this and make it less opaque is a massive value proposition.
Operations Manager, Marvell
Diagnosis saves test time by helping the design and test team with debug, preventing future issues.
Test Engineer, Advantest
Diagnosis ensures first time right results.
Test Engineer, IBM

Learn more

Explore more about why diagnosis matters and how improving semiconductor manufacturing yield—even by just 1%—can lead to millions of dollars in savings for high-volume products.

Touchscreen displaying a dashboard with data analytics, sales and operations charts, and KPI insights.
Webinar
all

Scan diagnosis – an essential component for yield

Join Jayant D’Souza as he presents on scan diagnosis basics and how some of the latest algorithms can be leveraged to reduce FA cycle time and yield analysis by up to 90%.

Interior of a data center server room featuring a curved hallway.
Article
all

Unlocking the value of yield

In this article, Marc Hutner talks about how diagnosis-driven yield analysis helps uncover previously unknown systematic issues and reduces physical failure analysis cycle time.